Research Patents
- "Multielement focused ion beams (MEFIB) from intense, collimated microwave plasmas: concepts to genesis of a novel device", US patent number 9576767 issued on 21 Feb 2017( through SIDBI center, IIT Kanpur) . ,
- "Measurement of submicron focused charged particle beams using a current flux grating : spider probe", US patent number 9733366, issued on 15 August 2017( through SIDBI center, IIT Kanpur) . ,
- "A method for transforming the wettability of a surface", Indian patent number 360984, issued on 12 March 2021( through SIDBI center, IIT Kanpur) . ,
- "An improved emission tomographic measurement system device and a method thereof", Indian patent number 386742, issued on 18 January 2022( through SIDBI center, IIT Kanpur) . ,
- "A compact table top plasma system in a dipole magnetic field for confinement of hot electrons : a unique device for plasma processing to simulating magnetospheres in the laboratory", Intellectual Property India( through SIDBI center, IIT Kanpur) 201911020452 (published in Official Journal No. 26/2020 dated 26-06-2020 of the Patent Office). ,